Showing results: 766 - 780 of 1032 items found.
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828 Series -
Leco Corp.
By incorporating state-of-the-art hardware and an on-board, touch-screen software platform, the 828 Series allows you to easily handle a wide range of sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass capability paired with cycle times as fast as 2.8 minutes make the 828 an ideal instrument for a diverse applications base, while delivering unparalleled sample analysis throughput.
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Ametek Scientific Instruments
Simultaneous Electrochemical Impedance Spectroscopy (EIS) tests can be run on multiple cells by connecting Solartron 1455A/1451A series frequency response analyzer (FRA) modules to the 1470E. These FRAs can operate in single sine correlation or multi-sine / Fast Fourier Transform (FFT) analysis mode, providing the ultimate in speed, precision and accuracy. The 1455A FRA provides high performance impedance measurements over the frequency range 10 μHz to 1 MHz, while the 1451A FRA operates from 10 μHz to 100 kHz.
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Thermo Fisher Scientific Inc.
Put our latest innovations in ion, gas and liquid chromatography to work in your laboratory. We’ve focused on developing leading-edge workflow solutions—from sample preparation, chromatographic separation, seamless integration with mass spectrometry, and data management and analysis—to meet today’s ever increasing demands for analytical performance, productivity and ease of use.
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GreenPoint® -
ON Semiconductor
The GreenPoint Design Simulation Tool is an interactive online design and verification tool to help you generate and validate an electronic design. The simulation module provides an interactive design and verification environment. The power analysis module provides an interactive environment to analyze the performance of intelligent power modules (IPMs). The Phase Noise Explorer module enables an interactive environment for advanced phase noise/jitter analysis of clock tree designs.
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Insight -
Autodesk, Inc.
Insight cloud service further empowers architects and integrated design teams with centralized access to building performance analysis data and advanced simulation engines.
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alpha300 access -
WITec
access is a micro-Raman single-spot analysis and mapping microscope. It was specifically engineered for budget-conscious customers with high demands on instrument performance. Its outstanding spectral quality, optical throughput and signal sensitivity are ensured by well-established WITec optical elements. The high-quality microscope setup of the access is also the basis for its full upgradability.
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ABB Ltd.
The ability to continuously and accurately measure water quality is a key requirement in many processes. Our trusted range of water analysis solutions provide real-time data on process conditions that can be used to improve efficiency, tighten performance and safeguard quality.
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DemiPG520 -
YEC Co. LTD
Main unit weight is approx. 650g, A5 size ultra compact design Results in superior portability, perfect for on-site data deletion, copy and backup.Clip (specified capacity) function installed Capacity of target HDD is identical to master HDD. This function can be disabled.Compatible with SATA II (3Gbps) Realizes high speed data transfer at 8.5GB per minute (*1).(*1 Transfer speed varies according to performance of connected devices.)Used area analysis and copy functions Used area analysis, copy & compare only for used area available.Compatible with MBR and GPT. FAT, FAT32, NTFS, EXT2, EXT3Deletion and quick diagnostic functions installed. Deletion: One-time, NSA, DoD, Quick diagnosis: SMART self diagnostic function
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SolarWinds
Monitoring and optimizing multiple DBMS platforms has never been simpler.* Intuitive performance analysis, * Blocking analysis, * Database, index, and query tuning advisors
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CT-7000 S3 -
Manta Test Systems
The CT-7000 S3 is Vanguard’s fourth generation EHV circuit breaker analyzer. The CT-7000 S3 is available with 3 (part number 9021-UC) or 6 contact timing channels (part number 9100-UC). The CT-7000 S3 can fully analyze a circuit breaker’s performance by measuring the main contact and resistor contact time, stroke, velocity, over-travel, bounce back and contact wipes. Both contact and motion analysis can be performed on all circuit breaker operations (OPEN, CLOSE, OPEN-CLOSE, CLOSE-OPEN, and OPEN CLOSE-OPEN). The CT-7000 S3’s timing window is selectable between 1 second, 10 seconds, and 20 seconds.
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TA Instruments
Dynamic Mechanical Analysis measures the mechanical properties of materials as a function of time, temperature, and frequency. In addition to basic material properties, DMA also quantifies finished part characteristics, reflecting the important contribution that processing has on end-use performance. DMA is commonly used to measure glass transition temperatures and secondary transitions, orientation caused by processing, cold crystallization, cure optimization, filler effects in composites, and much more. DMA provides an accurate measure of material stiffness (modulus) but also other important mechanical properties such as damping, creep, and stress relaxation.
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Dynatrace
Start Dynatracing your applications in minutes with easy deployment and zero-configuration.Auto-discover and map all applications and transaction-flows in your distributed environment.Leverage self-learning baselines with alerts, out-of-the-box dashboards and auto-correlated system monitoring.Find problems before your users notice them with smart, early production error detection.Configure, manage and update easily with a centralized configuration consoleeven for thousands systems.Enable easy access for everyone who needs it. Provide one system valuable to all stakeholders by de-coupling system access and performance analysis.
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National Technical Systems
NTS electronics failure analysis capabilities can be utilized to improve yield, determine root cause of failure, extrapolate life expectancy and improve reliability, and increase performance on integrated circuits (ICs), printed circuit boards (PCBs), and passive surface mount devices as well as materials and assemblies.Electronics F/A can provide detailed information regarding the performance of materials and devices in their intended end-use application. When a device or material does not meet its performance expectations, a F/A should be performed to identify the root cause of failure. The information presented in the root cause F/A will allow the product designer, manager, test and process engineers, or end-user to identify design, selection, test, and process deficiencies. Recommendations for corrective actions from the failure analysis report can then be evaluated and implemented to enhance product reliability and performance. By having an unbiased F/A performed by an independent test laboratory, the liability of a failed device or material can be converted into an asset, resulting in production of higher quality products.
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EPMA-1720 -
Shimadzu Corp.
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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E5061B -
Keysight Technologies
Select the best configuration for your test needs from a wide variety of test set options: 100 kHz to 1.5 GHz/ 3 GHz, 2-port, 50 or 75 ohm, transmission/reflection or S-parameter test set Address a broad range of applications with the LF-RF option (Option 3L5/3L4/3L3): 5 Hz to 3 GHz, 2-port, 50 ohm, S-parameter test set, gain-phase test port, built-in DC bias source Combine network analysis and impedance analysis to customize your application in a single instrument (Option3L5/3L4/3L3 plus 005) Every spec verified, adjustments included Lock in support & peak performance from the start
